返回首頁
 
[ 特殊顯微鏡設備 | Wafer Probing | 高階多功能型 12"用 ]

 ■Analytical Probe Station/4點探針/探針量測儀
   Manual Probe Station for wafer 12 "/高階多功能型12"用

 
Model:BD-12

 

 Features

   Huged-Knob Chuck Stage

 RF Probing Field Upgradable

 20X~4000X Magnification

 Backlash-Free Movement

 Platen Linear Quick Up/Down

 Easy Load/Unload wafer

 Platen Linear Fine Up/Down

 Probe Card Tip Overdrive Adjustment

 Choice Of Microscope (Tilt) Up/Down
 For E-Z Revoliving Objectives
 

 Specifications

 Vacuum Chuck

 12" Stainless Steel

 Chuck Stage

 12" x12" Travel

 Chuck Theta

 0~30 degree

  Platen Up/Down:

 6mm Adjustable

  Coarse Adjustment  Lever-Driven

 Platen Up/Down

 25 mm Adjustable

 Fine Adjustment  Hand Wheel-Driven

 Platen

 12 Micropositioner

 Microscope Stage

 1" x1" Travel

 Requirements

 Electrical

 110 VAC, 60Hz

   220 VAC, 60Hz

 Vacuum

 -250 mmHg, 7 liter/min

 Dimensions

 926mmW x 700mmD x 700mmH With Microscope

 Weight 150 Kg    With Microscope

 Accessories

 Wafer Chuck Pull-out Stage

 Miroscope Tilting Mechanism

 RF Prone/Cables

 Active Probes

 Low Current/Capacitance Probes

 High Voltage Probe

 Laser Cutter

 Ultrasonic Cutter

 CCTV System

 Photomicrographics

 Probe Card holder

 Packaged Device Holder

 PCB Holder

 Thermal Systems

 Liquid Crystal Kit

 Vibration Free Table

 Shielding Box

 Test Bench

 Instrument Case with Caster

 Dark Field/Normarski Inspection

 Chuck Vacuum Pattern

 Gold Plated Chuck

4 point probe station 4點探針 4點探針量測 四點探針量測儀4 point probe station四點探針量測儀 四點探針 探針卡 彈簧探針 晶圓探針 測試探針 探針座 四點探針量測 lcd測試探針 四點探針量測儀 探針專用機 探針量測 探針probe測試